Designing Accelerated Life Tests (ALT)

Picture of Adam Bahret
Adam Bahret
Screen Shot 2017 10 04 at 4.23.07 PM

I just returned from the IEEE ASQ Accelerated Stress Test and Reliability Conference, held this year in Austin, Texas.  It’s always been a great conference. There is such a good comradery and sharing of knowledge when a large group comes together on such a specific topic. I meet a lot of great people from many different industries, all with great experience to share.   We shared as much over dinner as we did in presentations, just with more colorful language. I presented a paper on considerations when designing an accelerated stress test (ALT) as well as common pitfalls I have witnessed.  I would love to hear any comments on the topic especially if you have “pro tips” for others developing Accelerated Life Tests.


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